Roberts, Gordon .  1959- <br/><br/>
An introduction to mixed-signal IC test and measurement / 
Gordon Roberts, Friedrich Taenzler and Mark Burns. 
 - 2nd ed.  Gordon Roberts, Friedrich Taenzler, Mark Burns. 
 - New York :  Oxford University Press,  c2012. 
 - xxv,836p. :  ill. ;  24 cm. 
 - The Oxford series in electrical and computer engineering .
<br/><br/> Includes index. 
<br/><br/>Includes bibliographical references. 
<br/><br/><br/> 
<br/><br/> "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--  "This contains the title page, copyright page, table of contents, first chapter, last chapter, and appendices"-- 
<br/><br/>
<br/><br/><br/>english 
<br/><br/><label>ISBN: </label>9780199796212  
<br/><br/><label>LCCN: </label>2011031312 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Testing.<br/>Mixed signal circuits--Testing.<br/>TECHNOLOGY & ENGINEERING / Electronics / Circuits / General.<br/>TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated.
<br/><br/><label>Dewey Class. No.: </label>621.3815/ROI