| 000 | 00592nam a2200217 4500 | ||
|---|---|---|---|
| 999 |
_c11452 _d11452 |
||
| 001 | 24540 | ||
| 003 | BD-ChUET | ||
| 005 | 20201001115840.0 | ||
| 008 | 201001b ||||| |||| 00| 0 eng d | ||
| 020 | _a0071134611 | ||
| 040 |
_aBD-ChUET _cBD-ChUET |
||
| 082 | _a621.380287/LEM | ||
| 100 | _aLenk, John D. | ||
| 245 |
_aMcgraw-Hill electronic testing handbook : _b procedures and techniques / _cJohn D. Lenk, |
||
| 260 |
_aNew Delhi: _bMcgraw-Hill, _cc1993. |
||
| 300 |
_axvii,397 p.: _c25 c.m. |
||
| 526 | _aEEE | ||
| 546 | _aEnglish | ||
| 650 | _aElectronic testing | ||
| 942 |
_2ddc _cBK |
||