000 01068cam a22003374a 4500
999 _c2604
_d2604
001 34770
003 BD-ChUET
005 20181030114020.0
008 990806s2000 flua b 001 0 eng
010 _a 99044876
020 _a0849300487 (alk. paper)
035 _a(DLC) 99044876
040 _aDLC
_cDLC
_dBD-ChUET
042 _apcc
050 0 0 _aTK5102.9
_b.S537 2000
082 0 0 _a621.382/WHS
_221
245 0 0 _aSignal measurement, analysis, and testing /
_cedited by Jerry C. Whitaker.
260 _aBoca Raton, FL :
_bCRC Press,
_cc2000.
300 _a313 p. :
_bill. ;
_c26 cm.
500 _aIncludes index
504 _aIncludes bibliographical references.
526 _aEEE
650 0 _aSignal processing
_xDigital techniques.
650 0 _aSystem analysis.
650 0 _aPhase distortion (Electronics)
700 _aWhitaker, Jerry C.
_eEditor
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0744/99044876-d.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK