| 000 | 00788nam a22002537a 4500 | ||
|---|---|---|---|
| 999 |
_c2658 _d2658 |
||
| 001 | 43940 | ||
| 003 | BD-ChUET | ||
| 005 | 20181105124204.0 | ||
| 008 | 180919b ||||| |||| 00| 0 eng d | ||
| 020 | _a8120316835 | ||
| 040 |
_aBD-ChUET _cBD-ChUET |
||
| 082 |
_222 _a621.397/SHS |
||
| 100 | _aSharma, Ashok K. | ||
| 245 |
_aSemiconductor memories: _btechnology, testing, and reliability / _cAshok K Sharma |
||
| 250 | _aEastern economy ed. | ||
| 260 |
_aNew Delhi: _bIEEE Press, _bPrentice Hall of India Private Limited, _cc1997. |
||
| 300 |
_axii,462p.: _btable, figs.; _c24 cm. |
||
| 500 | _aIncludes Index. | ||
| 504 | _aIncludes bibliographical reference (various chapter) | ||
| 526 | _aEEE | ||
| 546 | _aenglish | ||
| 650 | _aSemiconductor storage devices | ||
| 942 |
_2ddc _cBK |
||