000			02123cam a2200397 a 4500
999			_c6756 _d6756
001			48651
003			BD-ChUET
005			20191029101945.0
008			110829s2012 nyua b 001 0 eng
010			_a 2011031312
020			_a9780199796212
040			_aDLC _cDLC _dBD-ChUET
042			_apcc
082	0	0	_a621.3815/ROI _223
100	1	0	_aRoberts, Gordon . _d1959-
245	1	0	_aAn introduction to mixed-signal IC test and measurement / _cGordon Roberts, Friedrich Taenzler and Mark Burns.
250			_a2nd ed. _bGordon Roberts, Friedrich Taenzler, Mark Burns.
260			_aNew York : _bOxford University Press, _cc2012.
300			_axxv,836p. : _bill. ; _c24 cm.
490	0		_aThe Oxford series in electrical and computer engineering
500			_aIncludes index.
504			_aIncludes bibliographical references.
505	8		_a
520			_a"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"-- _cProvided by publisher.
520			_a"This contains the title page, copyright page, table of contents, first chapter, last chapter, and appendices"-- _cProvided by publisher.
526			_aEEE
546			_aenglish
650		0	_aIntegrated circuits _xTesting.
650		0	_aMixed signal circuits _xTesting.
650		7	_aTECHNOLOGY & ENGINEERING / Electronics / Circuits / General. _2bisacsh
650		7	_aTECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated. _2bisacsh
700	1		_aTaenzler, Friedrich.
700	1		_aBurns, Mark. _d1962-
906			_a7 _bcbc _corignew _d1 _eecip _f20 _gy-gencatlg
942			_2ddc _cBK