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An introduction to mixed-signal IC test and measurement / Gordon Roberts, Friedrich Taenzler and Mark Burns.

By: Roberts, Gordon, 1959-.
Contributor(s): Taenzler, Friedrich | Burns, Mark, 1962-.
Material type: materialTypeLabelBookSeries: The Oxford series in electrical and computer engineering.Publisher: New York : Oxford University Press, c2012Edition: 2nd ed. Gordon Roberts, Friedrich Taenzler, Mark Burns.Description: xxv,836p. : ill. ; 24 cm.ISBN: 9780199796212 .Subject(s): Integrated circuits -- Testing | Mixed signal circuits -- Testing | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General | TECHNOLOGY & ENGINEERING / Electronics / Circuits / IntegratedDDC classification: 621.3815/ROI
Contents:
Summary: "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"-- Provided by publisher.Summary: "This contains the title page, copyright page, table of contents, first chapter, last chapter, and appendices"-- Provided by publisher.
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Non-fiction 621.3815/ROI (Browse shelf) 1 Not For Loan 48651

Includes index.

Includes bibliographical references.


"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"-- Provided by publisher.

"This contains the title page, copyright page, table of contents, first chapter, last chapter, and appendices"-- Provided by publisher.

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